The SIGLENT SNA5000A series of Vector Network Analyzers have a frequency range of 9 kHz to 8.5 GHz, with 2 and 4 port models available. Designed to give you instant insight into scattering, differential, and time-domain measurements. They are effective instrumentation for determining the Q-factor, bandwidth, and insertion loss filters and feature impedance conversion, movement of measurement plane, limit testing, ripple test, fixture simulation, and adapter removal/insertion adjustments. There are five sweep types: Linear-Frequency, Log-Frequency, Power-Sweep, CW-Time, and Segment-Sweep mode. The SNA5000A series VNAs also support scattering-parameter correction of SOLT, SOLR, TRL, Response, and Enhanced Response for increased flexibility in R&D and manufacturing applications.
Frequency Range from 9 kHz up to 4.5 GHz / 8.5 GHz
Frequency resolution: 1 Hz
Level resolution: 0.05 dB
Range of IFBW: 10 Hz~3 MHz
Setting Range of Output Level: -55 ~ +10 dBm
Dynamic Range: 125 dB
2/4-ports: S-parameters, Balance Measurements, Time Domain
Measure: Q-factor, bandwidth and Insertion Loss
Interface: LAN, USB Device, USB Host(USB-GPIB)
Remote control: SCPI/Labview/IVI based on USB-TMC/VXI-11/Socket/Telnet/WebServer
12.1-inch touch screen
Video output: HDMI
Low noise floor for accurate measurements with a wide dynamic range
System Dynamic range, the difference between the measurement power available at the
test port and the noise floor of the receiver is critical parameters of a VNA. The SIGLENT
SNA5000A series’ dynamic range can up to 125 dB@10 Hz, satisfies some specific RF
test requirements like test in-band and out-of-band of filters simultaneously.
S-parameters and Balance Measurement
For the 4 ports S-parameters measurement of SNA5000A, multi traces in different windows
can be added, with the formats of Log Mag, Lin Mag, Phase, Delay, Smith, SWR, Polar, etc.
It is helpful for transmission/ reflection tracking, load match, and directivity analysis. These
traces can be saved as references or adding limits for pass/fail tests to improve the efficiency
during the antennas test and filter test.
Enhanced Time-Domain Analysis (TDR)
SNA5000A supports Enhanced Time Domain Analysis to measure impedance versus distance,
to distinguish between inductive and capacitive transitions. With time-domain gating, we can
isolate various sections of the fixture and see the effects in the frequency domain. Another
application for TDR is fault-location for coaxial cables in cellular and CATV installations.
Embedding and De-Embedding
There is a great challenge in RF & Microwave area to eliminate the harmful
ixture effects effectively. In most cases, the test result contains the features
of effect, because the specific effect connected the test terminal of instrument
and input terminal of the device during SMD testing. The SNA5000A applied
kinds of methods to minimum the effect caused by fixture effect, includes port
extension, port matching, port impedance conversion, de-embedding, adapter
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